Opto-electronic characterization of electron traps upon forming polymer

Qian Chen, B.F. Bory, A. Kiazadeh, P.R.F. Rocha, H.L. Gomes, F. Verbakel, D.M. Leeuw, de, S.C.J. Meskers

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Abstract

Metal-insulator-polymer diodes where the insulator is a thin oxide (Al2O3) layer are electroformed by applying a high bias. The initial stage is reversible and involves trapping of electrons near the oxide/polymer interface. The rate of charge trapping is limited by electron transport through the polymer. Detrapping of charge stored can be accomplished by illuminating with light under short-circuit conditions. The amount of stored charge is determined from the optically induced discharging current transient as a function of applied voltage and oxide thickness. When the charge density exceeds 8¿×¿1017/m2, an irreversible soft breakdown transition occurs to a non-volatile memory diode
Original languageEnglish
Article number083305
Pages (from-to)083305-1/3
Number of pages3
JournalApplied Physics Letters
Volume99
Issue number8
DOIs
Publication statusPublished - 2011

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