Optimal scan for pipelined testing: an asynchronous foundation

M. Roncken, E.H.L. Aarts, W.F.J. Verhaegh

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

17 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings IEEE International Test Conference 1996 (Washington DC, USA, October 20-25, 1996)
PublisherIEEE Computer Society
Pages215-224
ISBN (Print)0-7803-3541-4
Publication statusPublished - 1996

Cite this

Roncken, M., Aarts, E. H. L., & Verhaegh, W. F. J. (1996). Optimal scan for pipelined testing: an asynchronous foundation. In Proceedings IEEE International Test Conference 1996 (Washington DC, USA, October 20-25, 1996) (pp. 215-224). IEEE Computer Society.