Optimal scan for pipelined testing: an asynchronous foundation

M. Roncken, E.H.L. Aarts, W.F.J. Verhaegh

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings IEEE International Test Conference 1996 (Washington DC, USA, October 20-25, 1996)
Publisher	IEEE Computer Society
Pages	215-224
ISBN (Print)	0-7803-3541-4
Publication status	Published - 1996

Cite this

@inproceedings{38a6e24964af408988c6da259b82ec04,

title = "Optimal scan for pipelined testing: an asynchronous foundation",

author = "M. Roncken and E.H.L. Aarts and W.F.J. Verhaegh",

year = "1996",

language = "English",

isbn = "0-7803-3541-4",

pages = "215--224",

booktitle = "Proceedings IEEE International Test Conference 1996 (Washington DC, USA, October 20-25, 1996)",

publisher = "IEEE Computer Society",

address = "United States",

}