Optimal integration and test planning for lithographic systems

R. Boumen, I.S.M. Jong, de, J.M. Mortel - Fronczak, van de, J.E. Rooda

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

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Original languageEnglish
Title of host publicationTangram: Model-based integration and testing of complex high-tech systems
EditorsJ. Tretmans
Place of PublicationEindhoven
PublisherEmbedded Systems Institute
Pages73-84
ISBN (Print)978-90-78679-02-8
Publication statusPublished - 2007

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