Abstract
In the current integration and test phase of the development of a complex system, (the "right side" of the V-model) planning is becoming more and more difficult because of: 1) variability in delivery times of components, 2) failing tests and subsequent repairs, 3) resource changes and the use of component models, and 4) the growing system complexity and growing number of components and tests. Manually created integration and test plans are often not optimal regarding time-to-market. Furthermore, creating and maintaining these plans costs a lot of effort. In this paper, we introduce a method that allows to automatically create optimal integration and test plans. This method can be used by intelligent enterprises to shorten the time-to-market of a system and to reduce the effort needed to create and maintain integration and test plans. We illustrate this method with two cases studies related to the development of ASML lithographic machines (ASML 2006).
| Original language | English |
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| Title of host publication | Proceedings of the 17th International Symposium of the International Council on Systems Engineering (INCOSE 2007) 24-28 June 2007, San Diego, California, USA |
| Place of Publication | New York, New York, USA |
| Pages | 1/13- |
| Publication status | Published - 2007 |
| Event | 17th International Symposium of the InternationaI Council on Systems Engineering, INCOSE 2007 - San Diego, United States Duration: 24 Jun 2007 → 28 Jun 2007 Conference number: 17 |
Conference
| Conference | 17th International Symposium of the InternationaI Council on Systems Engineering, INCOSE 2007 |
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| Abbreviated title | INCOSE 2007 |
| Country/Territory | United States |
| City | San Diego |
| Period | 24/06/07 → 28/06/07 |