Optimal closed-loop identification test design for internal model control

Y. Zhu, P.P.J. Bosch, van den

Research output: Contribution to journalArticleAcademicpeer-review

26 Citations (Scopus)

Abstract

In this work, optimal closed-loop test design for control is studied. Simple design formulas are derived based on the asymptotic theory of Ljung. The control scheme used is internal model control (IMC) and the design constraint is the power of the process output or that of the reference signal. The test signal is applied at the setpoint. The results give clear guidelines for closed-loop identification applications.
Original languageEnglish
Pages (from-to)1237-1241
Number of pages5
JournalAutomatica
Volume36
Issue number8
DOIs
Publication statusPublished - 2000

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