Optical tracker using projective invariant marker pattern properties

R. Liere, van; J.D. Mulder

doi:10.1109/VR.2003.1191138

Optical tracker using projective invariant marker pattern properties

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

We describe a novel optical tracker algorithm for the tracking of interaction devices in virtual and augmented reality. The tracker uses invariant properties of marker patterns to efficiently identify and reconstruct the pose of these interaction devices. Since invariant properties are sensitive to noise in the 2D marker positions, an offline training session is used to determine deviations in these properties. These deviations are taken into account when searching for the patterns once the tracker is used.

Original language	English
Title of host publication	Proceedings IEEE Virtual Reality Conference 2003 (VR 2003, Los Angeles CA, USA, March 22-26, 2003)
Place of Publication	Los Alamitos CA
Publisher	IEEE Computer Society
Pages	191-198
ISBN (Print)	0-7695-1882-6
DOIs	https://doi.org/10.1109/VR.2003.1191138
Publication status	Published - 2003

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10.1109/VR.2003.1191138

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title = "Optical tracker using projective invariant marker pattern properties",

abstract = "We describe a novel optical tracker algorithm for the tracking of interaction devices in virtual and augmented reality. The tracker uses invariant properties of marker patterns to efficiently identify and reconstruct the pose of these interaction devices. Since invariant properties are sensitive to noise in the 2D marker positions, an offline training session is used to determine deviations in these properties. These deviations are taken into account when searching for the patterns once the tracker is used.",

author = "{Liere, van}, R. and J.D. Mulder",

year = "2003",

doi = "10.1109/VR.2003.1191138",

language = "English",

isbn = "0-7695-1882-6",

pages = "191--198",

booktitle = "Proceedings IEEE Virtual Reality Conference 2003 (VR 2003, Los Angeles CA, USA, March 22-26, 2003)",

publisher = "IEEE Computer Society",

address = "United States",

}

Optical tracker using projective invariant marker pattern properties. / Liere, van, R.; Mulder, J.D.
Proceedings IEEE Virtual Reality Conference 2003 (VR 2003, Los Angeles CA, USA, March 22-26, 2003). Los Alamitos CA: IEEE Computer Society, 2003. p. 191-198.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

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AU - Mulder, J.D.

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N2 - We describe a novel optical tracker algorithm for the tracking of interaction devices in virtual and augmented reality. The tracker uses invariant properties of marker patterns to efficiently identify and reconstruct the pose of these interaction devices. Since invariant properties are sensitive to noise in the 2D marker positions, an offline training session is used to determine deviations in these properties. These deviations are taken into account when searching for the patterns once the tracker is used.

AB - We describe a novel optical tracker algorithm for the tracking of interaction devices in virtual and augmented reality. The tracker uses invariant properties of marker patterns to efficiently identify and reconstruct the pose of these interaction devices. Since invariant properties are sensitive to noise in the 2D marker positions, an offline training session is used to determine deviations in these properties. These deviations are taken into account when searching for the patterns once the tracker is used.

U2 - 10.1109/VR.2003.1191138

DO - 10.1109/VR.2003.1191138

M3 - Conference contribution

SN - 0-7695-1882-6

SP - 191

EP - 198

BT - Proceedings IEEE Virtual Reality Conference 2003 (VR 2003, Los Angeles CA, USA, March 22-26, 2003)

PB - IEEE Computer Society

CY - Los Alamitos CA

ER -

Optical tracker using projective invariant marker pattern properties

Abstract

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