Open standard test framework for photonic integrated circuits

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Test, assembly and packaging processes substantially contribute to the overall production cost of photonic integrated circuits. Implementation of test processes across the full production chain is critical in order to deliver statistically significant data sets. These will allow for optimization of the fabrication process widows, early known-good-die selection, improved models in design tools and lead to improved yield, reduced cost and scalability which will open a path to volume production. Progress on developments of open access test infrastructure at our laboratories and open standard test framework will be presented.

Original languageEnglish
Title of host publication21st International Conference on Transparent Optical Networks, ICTON 2019
Place of PublicationPiscataway
PublisherIEEE Computer Society
Number of pages4
ISBN (Electronic)9781728127798
DOIs
Publication statusPublished - 1 Jul 2019
Event21st International Conference on Transparent Optical Networks, ICTON 2019 - Angers, France
Duration: 9 Jul 201913 Jul 2019
http://www.icton2019.com/index.php

Conference

Conference21st International Conference on Transparent Optical Networks, ICTON 2019
Abbreviated titleICTON2019
CountryFrance
CityAngers
Period9/07/1913/07/19
Internet address

Fingerprint

Photonics
Integrated circuits
Scalability
Costs
Packaging
Fabrication

Keywords

  • Integrated photonics
  • Photonic integrated circuits
  • Photonic integration
  • Test
  • Test automation

Cite this

Latkowski, S., Pustakhod, D., Chatzimichailidis, M., Leijtens, X., & Williams, K. (2019). Open standard test framework for photonic integrated circuits. In 21st International Conference on Transparent Optical Networks, ICTON 2019 [Sa.A5.4 ] Piscataway: IEEE Computer Society. https://doi.org/10.1109/ICTON.2019.8840336
Latkowski, Sylwester ; Pustakhod, Dzmitry ; Chatzimichailidis, Michail ; Leijtens, Xaveer ; Williams, Kevin. / Open standard test framework for photonic integrated circuits. 21st International Conference on Transparent Optical Networks, ICTON 2019. Piscataway : IEEE Computer Society, 2019.
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Latkowski, S, Pustakhod, D, Chatzimichailidis, M, Leijtens, X & Williams, K 2019, Open standard test framework for photonic integrated circuits. in 21st International Conference on Transparent Optical Networks, ICTON 2019., Sa.A5.4 , IEEE Computer Society, Piscataway, 21st International Conference on Transparent Optical Networks, ICTON 2019, Angers, France, 9/07/19. https://doi.org/10.1109/ICTON.2019.8840336

Open standard test framework for photonic integrated circuits. / Latkowski, Sylwester; Pustakhod, Dzmitry; Chatzimichailidis, Michail; Leijtens, Xaveer; Williams, Kevin.

21st International Conference on Transparent Optical Networks, ICTON 2019. Piscataway : IEEE Computer Society, 2019. Sa.A5.4 .

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Latkowski S, Pustakhod D, Chatzimichailidis M, Leijtens X, Williams K. Open standard test framework for photonic integrated circuits. In 21st International Conference on Transparent Optical Networks, ICTON 2019. Piscataway: IEEE Computer Society. 2019. Sa.A5.4 https://doi.org/10.1109/ICTON.2019.8840336