Open standard test framework for photonic integrated circuits

Sylwester Latkowski; Dzmitry Pustakhod; Michail Chatzimichailidis; Xaveer Leijtens; Kevin Williams

doi:10.1109/ICTON.2019.8840336

Open standard test framework for photonic integrated circuits

Sylwester Latkowski, Dzmitry Pustakhod, Michail Chatzimichailidis, Xaveer Leijtens, Kevin Williams

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

Test, assembly and packaging processes substantially contribute to the overall production cost of photonic integrated circuits. Implementation of test processes across the full production chain is critical in order to deliver statistically significant data sets. These will allow for optimization of the fabrication process widows, early known-good-die selection, improved models in design tools and lead to improved yield, reduced cost and scalability which will open a path to volume production. Progress on developments of open access test infrastructure at our laboratories and open standard test framework will be presented.

Original language	English
Title of host publication	21st International Conference on Transparent Optical Networks, ICTON 2019
Place of Publication	Piscataway
Publisher	IEEE Computer Society
Number of pages	4
ISBN (Electronic)	9781728127798
DOIs	https://doi.org/10.1109/ICTON.2019.8840336
Publication status	Published - 1 Jul 2019
Event	21st International Conference on Transparent Optical Networks (ICTON 2019) - Angers, France Duration: 9 Jul 2019 → 13 Jul 2019 http://www.icton2019.com/index.php

Conference

Conference	21st International Conference on Transparent Optical Networks (ICTON 2019)
Abbreviated title	ICTON2019
Country/Territory	France
City	Angers
Period	9/07/19 → 13/07/19
Internet address	http://www.icton2019.com/index.php

Keywords

Integrated photonics
Photonic integrated circuits
Photonic integration
Test
Test automation

Access to Document

10.1109/ICTON.2019.8840336

Cite this

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title = "Open standard test framework for photonic integrated circuits",

abstract = "Test, assembly and packaging processes substantially contribute to the overall production cost of photonic integrated circuits. Implementation of test processes across the full production chain is critical in order to deliver statistically significant data sets. These will allow for optimization of the fabrication process widows, early known-good-die selection, improved models in design tools and lead to improved yield, reduced cost and scalability which will open a path to volume production. Progress on developments of open access test infrastructure at our laboratories and open standard test framework will be presented.",

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Latkowski, S , Pustakhod, D, Chatzimichailidis, M, Leijtens, X & Williams, K 2019, Open standard test framework for photonic integrated circuits. in 21st International Conference on Transparent Optical Networks, ICTON 2019., Sa.A5.4 , IEEE Computer Society, Piscataway, 21st International Conference on Transparent Optical Networks (ICTON 2019), Angers, France, 9/07/19. https://doi.org/10.1109/ICTON.2019.8840336

Open standard test framework for photonic integrated circuits. / Latkowski, Sylwester ; Pustakhod, Dzmitry; Chatzimichailidis, Michail et al.
21st International Conference on Transparent Optical Networks, ICTON 2019. Piscataway: IEEE Computer Society, 2019. Sa.A5.4 .

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Open standard test framework for photonic integrated circuits

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Conference

Keywords

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