One‐step deposition of nano‐to‐micron‐scalable, high‐quality digital image correlation patterns for high‐strain in‐situ multi‐microscopy testing

Johan Hoefnagels (Corresponding author), Marc van Maris, Tijmen Vermeij

Research output: Contribution to journal › Article › Academic › peer-review

45 Citations (Scopus)
275 Downloads (Pure)

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