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On-wafer W-band determination of the driving point impedance of a double slot antenna

  • I.G. Thayne
  • , D.L. Edgar
  • , K. Elgaid
  • , H. Chong
  • , M. Jubber
  • , H. McLelland
  • , S. Ferguson
  • , A. Ross
  • , J.M. Arnold
  • , R.M. Heeres
  • , N. Whybourn
  • , W. Luinge
  • , M.J.M. Vorst, van der
  • , A. Neto
  • , P.J.I. de Maagt

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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    Abstract

    Part of the ESTEC funded Integrated Antenna Development project includes the development of an optimised 500 GHz planar antenna on a dielectric lens. One aspect of this study involves the development of an accurate model for the antenna impedance at the point where a bolometric detector is inserted in the receiver. To verify the modelling, an on-wafer measurement strategy to determine the driving point impedance of a 100 GHz scale model of the antenna structure was developed. This paper describes the W-band on-wafer measurement technique and compares the experimentally and theoretically derived feed point impedances of the antenna structures.
    Original languageEnglish
    Title of host publicationIEE Colloquium on Microwave Measurements: Current Techniques and Trends, 22-23 February 1999, London, UK
    Pages3/1-3/4
    DOIs
    Publication statusPublished - 1999
    EventIEE Colloquium on Microwave Measurements: Current Techniques and Trends : February 23, 1999, London, UK - Savoy Place, London
    Duration: 23 Feb 1999 → 23 Feb 1999

    Publication series

    NameIEE Colloquium Digest
    PublisherIEE
    Volume1999-008
    ISSN (Print)0963-3308

    Conference

    ConferenceIEE Colloquium on Microwave Measurements: Current Techniques and Trends : February 23, 1999, London, UK
    CityLondon
    Period23/02/99 → 23/02/99

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