Original language | English |
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Pages (from-to) | 495306/1-1/17 |
Number of pages | 18 |
Journal | Journal of Physics D: Applied Physics |
Volume | 47 |
Issue number | 49 |
DOIs | |
Publication status | Published - 2014 |
On-wafer time-dependent high reproducibility nano-force tensile testing.
L.I.J.C. Bergers, J.P.M. Hoefnagels, M.G.D. Geers
Research output: Contribution to journal › Article › Academic › peer-review
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