Abstract
An on-wafer measurement strategy for determining the driving point impedance of a planar 100 GHz double slot antenna is presented. The technique is verified by comparison with a theoretical determination of the antenna impedance
| Original language | English |
|---|---|
| Pages (from-to) | 1291-1292 |
| Number of pages | 2 |
| Journal | Electronics Letters |
| Volume | 35 |
| Issue number | 16 |
| DOIs | |
| Publication status | Published - 1999 |