On using IEEE P1500SECT for test plug-n-play

E.J. Marinissen; R. Kapur; Y. Zorian

doi:10.1109/TEST.2000.894273

On using IEEE P1500SECT for test plug-n-play

E.J. Marinissen
, R. Kapur
, Y. Zorian

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Abstract

System chips are increasingly designed by embedding reusable cores. A core-based test strategy for such ICs is often attractive and sometimes even mandatory. IEEE P1500 SECT is a standard under development that standardizes a core test language and a core wrapper, in order to facilitate plug-n-play core testing. In this paper, we describe how one standard supports both easy integration and interoperability as well as flexibility and scalability. Possible usage scenarios of the standard for core providers, core users, and EDA tool developers are sketched.

Original language	English
Title of host publication	Proceedings International Test Conference 2000
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	770-777
ISBN (Print)	0-7803-6546-1
DOIs	https://doi.org/10.1109/TEST.2000.894273
Publication status	Published - 2000
Externally published	Yes

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10.1109/TEST.2000.894273

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abstract = "System chips are increasingly designed by embedding reusable cores. A core-based test strategy for such ICs is often attractive and sometimes even mandatory. IEEE P1500 SECT is a standard under development that standardizes a core test language and a core wrapper, in order to facilitate plug-n-play core testing. In this paper, we describe how one standard supports both easy integration and interoperability as well as flexibility and scalability. Possible usage scenarios of the standard for core providers, core users, and EDA tool developers are sketched.",

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DO - 10.1109/TEST.2000.894273

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BT - Proceedings International Test Conference 2000

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

ER -

On using IEEE P1500SECT for test plug-n-play

Abstract

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