On the influence of coding on the mean time to failure for degrading memories with defects

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

262 Downloads (Pure)

Abstract

no abstract.

Original language	English
Title of host publication	Proceedings of the 1989 IEEE/CAM Information Theory Workshop at Cornell, 25-29 june 1989, Ithaca NY, USA
Publisher	Institute of Electrical and Electronics Engineers
Pages	7-1-
DOIs	https://doi.org/10.1109/ITW.1989.761430
Publication status	Published - 1989

@inproceedings{899a21e7518e44728f87bd558773f739,

title = "On the influence of coding on the mean time to failure for degrading memories with defects",

abstract = "no abstract.",

author = "A.J. Vinck and K.A. Post",

year = "1989",

doi = "10.1109/ITW.1989.761430",

language = "English",

pages = "7--1--",

booktitle = "Proceedings of the 1989 IEEE/CAM Information Theory Workshop at Cornell, 25-29 june 1989, Ithaca NY, USA",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

}

On the influence of coding on the mean time to failure for degrading memories with defects. / Vinck, A.J.; Post, K.A.
Proceedings of the 1989 IEEE/CAM Information Theory Workshop at Cornell, 25-29 june 1989, Ithaca NY, USA. Institute of Electrical and Electronics Engineers, 1989. p. 7-1-.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - On the influence of coding on the mean time to failure for degrading memories with defects

AU - Vinck, A.J.

AU - Post, K.A.

PY - 1989

Y1 - 1989

N2 - no abstract.

AB - no abstract.

U2 - 10.1109/ITW.1989.761430

DO - 10.1109/ITW.1989.761430

M3 - Conference contribution

SP - 7-1-

BT - Proceedings of the 1989 IEEE/CAM Information Theory Workshop at Cornell, 25-29 june 1989, Ithaca NY, USA

PB - Institute of Electrical and Electronics Engineers

ER -