On the influence of coding on the mean time to failure for degrading memories with defects

A.J. Vinck, K.A. Post

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
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Abstract

no abstract.
Original languageEnglish
Title of host publicationProceedings of the 1989 IEEE/CAM Information Theory Workshop at Cornell, 25-29 june 1989, Ithaca NY, USA
PublisherInstitute of Electrical and Electronics Engineers
Pages7-1-
DOIs
Publication statusPublished - 1989

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    Vinck, A. J., & Post, K. A. (1989). On the influence of coding on the mean time to failure for degrading memories with defects. In Proceedings of the 1989 IEEE/CAM Information Theory Workshop at Cornell, 25-29 june 1989, Ithaca NY, USA (pp. 7-1-). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ITW.1989.761430