On the distribution of extrinsic L-values in gray-mapped 16-QAM

A. Alvarado; L.L. Szczecinski; R. Feick

doi:10.1145/1280940.1281011

On the distribution of extrinsic L-values in gray-mapped 16-QAM

A. Alvarado, L.L. Szczecinski, R. Feick

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (SciVal)

Abstract

In this paper we address the issue of probabilistic modelling of the extrinsic L-values, used as reliability metrics in the context of bit interleaved coded modulation with iterative demapping (BICM-ID). Starting with a simple piece-wise linear model of the L-values obtained via the max-log approximation, we derive the expressions for the cumulative distribution functions of the L-values, that differentiated produce the desired forms of the probability density functions for Gray-mapped 16-QAM. To illustrate the usefulness of our analytical expressions we applied them to efficiently compute the so-called EXIT functions of the demapper for different values of SNR. The proposed analytical expressions are also compared to thehistograms of the L-values obtained through time-consuming simulations.

Original language	English
Title of host publication	2007 AMC International Wireless Communications and Mobile Computing Conference (IWCMC)
Place of Publication	New York
Publisher	Association for Computing Machinery, Inc
Pages	329-336
ISBN (Print)	978-1-59593-695-0
DOIs	https://doi.org/10.1145/1280940.1281011
Publication status	Published - 2007
Event	the 2007 international conference - Honolulu, Hawaii, USA Duration: 12 Aug 2007 → 16 Aug 2007

Conference

Conference	the 2007 international conference
Period	12/08/07 → 16/08/07

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10.1145/1280940.1281011

Cite this

@inproceedings{c7d174ddb52c4171af919cf16bd6115e,

title = "On the distribution of extrinsic L-values in gray-mapped 16-QAM",

abstract = "In this paper we address the issue of probabilistic modelling of the extrinsic L-values, used as reliability metrics in the context of bit interleaved coded modulation with iterative demapping (BICM-ID). Starting with a simple piece-wise linear model of the L-values obtained via the max-log approximation, we derive the expressions for the cumulative distribution functions of the L-values, that differentiated produce the desired forms of the probability density functions for Gray-mapped 16-QAM. To illustrate the usefulness of our analytical expressions we applied them to efficiently compute the so-called EXIT functions of the demapper for different values of SNR. The proposed analytical expressions are also compared to thehistograms of the L-values obtained through time-consuming simulations.",

author = "A. Alvarado and L.L. Szczecinski and R. Feick",

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doi = "10.1145/1280940.1281011",

language = "English",

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pages = "329--336",

booktitle = "2007 AMC International Wireless Communications and Mobile Computing Conference (IWCMC)",

publisher = "Association for Computing Machinery, Inc",

address = "United States",

note = "the 2007 international conference ; Conference date: 12-08-2007 Through 16-08-2007",

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On the distribution of extrinsic L-values in gray-mapped 16-QAM. / Alvarado, A.; Szczecinski, L.L.; Feick, R.
2007 AMC International Wireless Communications and Mobile Computing Conference (IWCMC). New York: Association for Computing Machinery, Inc, 2007. p. 329-336.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - On the distribution of extrinsic L-values in gray-mapped 16-QAM

AU - Alvarado, A.

AU - Szczecinski, L.L.

AU - Feick, R.

PY - 2007

Y1 - 2007

N2 - In this paper we address the issue of probabilistic modelling of the extrinsic L-values, used as reliability metrics in the context of bit interleaved coded modulation with iterative demapping (BICM-ID). Starting with a simple piece-wise linear model of the L-values obtained via the max-log approximation, we derive the expressions for the cumulative distribution functions of the L-values, that differentiated produce the desired forms of the probability density functions for Gray-mapped 16-QAM. To illustrate the usefulness of our analytical expressions we applied them to efficiently compute the so-called EXIT functions of the demapper for different values of SNR. The proposed analytical expressions are also compared to thehistograms of the L-values obtained through time-consuming simulations.

AB - In this paper we address the issue of probabilistic modelling of the extrinsic L-values, used as reliability metrics in the context of bit interleaved coded modulation with iterative demapping (BICM-ID). Starting with a simple piece-wise linear model of the L-values obtained via the max-log approximation, we derive the expressions for the cumulative distribution functions of the L-values, that differentiated produce the desired forms of the probability density functions for Gray-mapped 16-QAM. To illustrate the usefulness of our analytical expressions we applied them to efficiently compute the so-called EXIT functions of the demapper for different values of SNR. The proposed analytical expressions are also compared to thehistograms of the L-values obtained through time-consuming simulations.

U2 - 10.1145/1280940.1281011

DO - 10.1145/1280940.1281011

M3 - Conference contribution

SN - 978-1-59593-695-0

SP - 329

EP - 336

BT - 2007 AMC International Wireless Communications and Mobile Computing Conference (IWCMC)

PB - Association for Computing Machinery, Inc

CY - New York

T2 - the 2007 international conference

Y2 - 12 August 2007 through 16 August 2007

ER -

On the distribution of extrinsic L-values in gray-mapped 16-QAM

Abstract

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