On the connection between different noise structures for LPV-SS models

Research output: Book/ReportReportAcademic

LanguageEnglish
Place of PublicationEindhoven
PublisherEindhoven University of Technology
Number of pages7
StatePublished - 1 Apr 2016

Publication series

NameTechnical Report TUE CS
PublisherTechnical University Eindhoven
VolumeTUE-CS-2016-003

Bibliographical note

Technical report TUE-CS-2016-003

Cite this

Cox, P. B., & Toth, R. (2016). On the connection between different noise structures for LPV-SS models. (Technical Report TUE CS; Vol. TUE-CS-2016-003). Eindhoven: Eindhoven University of Technology.
Cox, P.B. ; Toth, R./ On the connection between different noise structures for LPV-SS models. Eindhoven : Eindhoven University of Technology, 2016. 7 p. (Technical Report TUE CS).
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title = "On the connection between different noise structures for LPV-SS models",
author = "P.B. Cox and R. Toth",
note = "Technical report TUE-CS-2016-003",
year = "2016",
month = "4",
day = "1",
language = "English",
series = "Technical Report TUE CS",
publisher = "Eindhoven University of Technology",

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Cox, PB & Toth, R 2016, On the connection between different noise structures for LPV-SS models. Technical Report TUE CS, vol. TUE-CS-2016-003, Eindhoven University of Technology, Eindhoven.

On the connection between different noise structures for LPV-SS models. / Cox, P.B.; Toth, R.

Eindhoven : Eindhoven University of Technology, 2016. 7 p. (Technical Report TUE CS; Vol. TUE-CS-2016-003).

Research output: Book/ReportReportAcademic

TY - BOOK

T1 - On the connection between different noise structures for LPV-SS models

AU - Cox,P.B.

AU - Toth,R.

N1 - Technical report TUE-CS-2016-003

PY - 2016/4/1

Y1 - 2016/4/1

M3 - Report

T3 - Technical Report TUE CS

BT - On the connection between different noise structures for LPV-SS models

PB - Eindhoven University of Technology

CY - Eindhoven

ER -

Cox PB, Toth R. On the connection between different noise structures for LPV-SS models. Eindhoven: Eindhoven University of Technology, 2016. 7 p. (Technical Report TUE CS).