| Original language | English |
|---|---|
| Title of host publication | Proceedings International Workshop on Defect Based Testing, 2001 |
| Pages | 17-22 |
| Publication status | Published - 2001 |
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On Electrical Fault Diagnosis in Full-Scan Circuits
- S.C. Hora
- , W. Beverloo
- , M. Lousberg
- , M.T.M. Segers
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review