Original language | English |
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Title of host publication | Proceedings International Workshop on Defect Based Testing, 2001 |
Pages | 17-22 |
Publication status | Published - 2001 |
On Electrical Fault Diagnosis in Full-Scan Circuits
S.C. Hora, W. Beverloo, M. Lousberg, M.T.M. Segers
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review