On Electrical Fault Diagnosis in Full-Scan Circuits

S.C. Hora, W. Beverloo, M. Lousberg, M.T.M. Segers

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationProceedings International Workshop on Defect Based Testing, 2001
    Pages17-22
    Publication statusPublished - 2001

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