On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections

Marco Gagino; Alonso Millan-Mejia; Erwin Bente; Victor Dolores-Calzadilla

doi:10.1007/978-3-031-63378-2_80

On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections

Marco Gagino, Alonso Millan-Mejia, Erwin Bente, Victor Dolores-Calzadilla

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

We present an InP optical phased array with on-chip calibration capabilities. The on-chip calibration relies on reflecting some of the light at the optical antennas back into the OPA input waveguide and measuring the phase difference between consecutive arms through an mREV calibration algorithm. We employ a spurious low-level (<0.1%) reflection at the OPA facet, and we demonstrate that it is enough to calibrate the PIC using this method. Moreover, we calibrate following both a free-space and on-chip method and measure negligible variations of sidelobe-suppression ratio and beam width respectively, showing comparable calibration accuracies for the two methods.

Original language	English
Title of host publication	The 25th European Conference on Integrated Optics
Subtitle of host publication	Proceedings of ECIO 2024, June 17–19, Aachen, Germany
Editors	Jeremy Witzens, Joyce Poon, Lars Zimmermann, Wolfgang Freude
Publisher	Springer
Pages	493-499
Number of pages	7
ISBN (Electronic)	978-3-031-63378-2
ISBN (Print)	978-3-031-63377-5, 978-3-031-63380-5
DOIs	https://doi.org/10.1007/978-3-031-63378-2_80
Publication status	Published - 16 Jun 2024
Event	25th European Conference on Integrated Optics, ECIO 2024 - Aachen, Germany Duration: 17 Jun 2024 → 19 Jun 2024

Publication series

Name	Springer Proceedings in Physics
Volume	402
ISSN (Print)	0930-8989
ISSN (Electronic)	1867-4941

Conference

Conference	25th European Conference on Integrated Optics, ECIO 2024
Country/Territory	Germany
City	Aachen
Period	17/06/24 → 19/06/24

Keywords

Calibration
Integrated Photonics
Optical Phased Array

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10.1007/978-3-031-63378-2_80

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Gagino, M., Millan-Mejia, A., Bente, E., & Dolores-Calzadilla, V. (2024). On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. In J. Witzens, J. Poon, L. Zimmermann, & W. Freude (Eds.), The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany (pp. 493-499). (Springer Proceedings in Physics; Vol. 402). Springer. https://doi.org/10.1007/978-3-031-63378-2_80

Gagino, Marco ; Millan-Mejia, Alonso ; Bente, Erwin et al. / On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany. editor / Jeremy Witzens ; Joyce Poon ; Lars Zimmermann ; Wolfgang Freude. Springer, 2024. pp. 493-499 (Springer Proceedings in Physics).

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abstract = "We present an InP optical phased array with on-chip calibration capabilities. The on-chip calibration relies on reflecting some of the light at the optical antennas back into the OPA input waveguide and measuring the phase difference between consecutive arms through an mREV calibration algorithm. We employ a spurious low-level (<0.1%) reflection at the OPA facet, and we demonstrate that it is enough to calibrate the PIC using this method. Moreover, we calibrate following both a free-space and on-chip method and measure negligible variations of sidelobe-suppression ratio and beam width respectively, showing comparable calibration accuracies for the two methods.",

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Gagino, M, Millan-Mejia, A, Bente, E & Dolores-Calzadilla, V 2024, On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. in J Witzens, J Poon, L Zimmermann & W Freude (eds), The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany. Springer Proceedings in Physics, vol. 402, Springer, pp. 493-499, 25th European Conference on Integrated Optics, ECIO 2024, Aachen, Germany, 17/06/24. https://doi.org/10.1007/978-3-031-63378-2_80

On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. / Gagino, Marco; Millan-Mejia, Alonso; Bente, Erwin et al.
The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany. ed. / Jeremy Witzens; Joyce Poon; Lars Zimmermann; Wolfgang Freude. Springer, 2024. p. 493-499 (Springer Proceedings in Physics; Vol. 402).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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N2 - We present an InP optical phased array with on-chip calibration capabilities. The on-chip calibration relies on reflecting some of the light at the optical antennas back into the OPA input waveguide and measuring the phase difference between consecutive arms through an mREV calibration algorithm. We employ a spurious low-level (<0.1%) reflection at the OPA facet, and we demonstrate that it is enough to calibrate the PIC using this method. Moreover, we calibrate following both a free-space and on-chip method and measure negligible variations of sidelobe-suppression ratio and beam width respectively, showing comparable calibration accuracies for the two methods.

AB - We present an InP optical phased array with on-chip calibration capabilities. The on-chip calibration relies on reflecting some of the light at the optical antennas back into the OPA input waveguide and measuring the phase difference between consecutive arms through an mREV calibration algorithm. We employ a spurious low-level (<0.1%) reflection at the OPA facet, and we demonstrate that it is enough to calibrate the PIC using this method. Moreover, we calibrate following both a free-space and on-chip method and measure negligible variations of sidelobe-suppression ratio and beam width respectively, showing comparable calibration accuracies for the two methods.

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Gagino M, Millan-Mejia A, Bente E , Dolores-Calzadilla V. On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections. In Witzens J, Poon J, Zimmermann L, Freude W, editors, The 25th European Conference on Integrated Optics: Proceedings of ECIO 2024, June 17–19, Aachen, Germany. Springer. 2024. p. 493-499. (Springer Proceedings in Physics). doi: 10.1007/978-3-031-63378-2_80

On-Chip Calibration of an Optical Phased Array Through Chip Facet Reflections

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