On 1/f noise in polysilicon emitter bipolar transistors: coherence between base current noise and emitter series resistance noise

H.A.W. Markus, Ph. Roche, T.G.M. Kleinpenning

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 26th ESSDERC
Pages787-790
Publication statusPublished - 1996
Event26th European Solid State Device Research Conference (ESSDERC'96), 9-11 September 1996, Bologna, Italy - Bologna, Italy
Duration: 9 Sep 199611 Sep 1996
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5435100

Conference

Conference26th European Solid State Device Research Conference (ESSDERC'96), 9-11 September 1996, Bologna, Italy
Abbreviated titleESSDERC '96
CountryItaly
CityBologna
Period9/09/9611/09/96
OtherProc. 26th ESSDERC, Bologna, Italy, 9-11 September 1996
Internet address

Cite this

Markus, H. A. W., Roche, P., & Kleinpenning, T. G. M. (1996). On 1/f noise in polysilicon emitter bipolar transistors: coherence between base current noise and emitter series resistance noise. In Proc. 26th ESSDERC (pp. 787-790)