Observation of dynamic extinction ratio and bit error rate degradation due to thermal effects in integrated modulators

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Abstract

We experimentally demonstrate how the thermal crosstalk between active and passive components limits the performance of integrated Mach-Zehnder modulators operating in radiofrequency regime. To evaluate the role of the distance between active and passive components, the MZs are placed at different distances with respect to a Semiconductor Optical Amplifier that represents the heat source. The thermal crosstalk is quantified by measuring the effects on the electro-optical response of MZ modulators considered as test structure. Both extinction ratio and bit error rate degradation are measured. The proposed investigation allows the introduction of design rules, based on the minimum distance between components to ultimately avoid unwanted thermal effects. According to the result provided by our analysis, we also show how the ER degradation can be recovered.

Original languageEnglish
Title of host publicationIntegrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015
PublisherOptical Society of America (OSA)
ISBN (Print)9781557520005
DOIs
Publication statusPublished - 1 Jan 2015
EventIntegrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015 - Boston, United States
Duration: 27 Jun 20151 Jul 2015

Conference

ConferenceIntegrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015
CountryUnited States
CityBoston
Period27/06/151/07/15

Keywords

  • Crosstalk
  • Index Terms-Indium compounds
  • Thermo-optic effects

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    Gilardi, G., Yao, W., Smit, M. K., & Wale, M. J. (2015). Observation of dynamic extinction ratio and bit error rate degradation due to thermal effects in integrated modulators. In Integrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015 [JM3A.18] Optical Society of America (OSA). https://doi.org/10.1364/IPRSN.2015.JM3A.18