Novel on-wafer technique for loss characterization

E. Bitincka, M.K. Smit

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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We report for the first time an on-wafer propagation loss characterization technique that simplifies and speeds up the validation process. The small footprint (1.5 mm2) and high accuracy (±0.23 dB/cm) make this method ideal for PIC mass production.
Original languageEnglish
Title of host publicationProceedings of the Integrated Photonics Research, Silicon and Nanophotonics. July 13-17, 2014, San Diego, California United States
PublisherOptical Society of America (OSA)
ISBN (Print)978-1-55752-737-0
Publication statusPublished - 2014
EventIntegrated Photonics Research, Silicon and Nanophotonics, IPRSN 2014 - San Diego, CA, United States
Duration: 13 Jul 201417 Jul 2014


ConferenceIntegrated Photonics Research, Silicon and Nanophotonics, IPRSN 2014
Abbreviated titleIPR '14
Country/TerritoryUnited States
CitySan Diego, CA


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