Novel Diagnostics to Assess Stress-Depth Profiles and Mechanics in Multi-Layer Thin Films

Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e)

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Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Mechanical Engineering
Supervisors/Advisors	Hoefnagels, Johan P.M., Promotor Geers, Marc G.D., Promotor van der Sluis, Olaf, Copromotor
Award date	19 Dec 2024
Place of Publication	Eindhoven
Publisher	Eindhoven University of Technology
Print ISBNs	978-94-6510-353-2
Electronic ISBNs	978-90-386-6201-5
Publication status	Published - 19 Dec 2024

Proefschrift.

Access to Document

@phdthesis{35df57baa86e4394a09bf595755c6369,

title = "Novel Diagnostics to Assess Stress-Depth Profiles and Mechanics in Multi-Layer Thin Films",

author = "Martens, {Robin Francis Martin}",

note = "Proefschrift.",

year = "2024",

month = dec,

day = "19",

language = "English",

isbn = "978-94-6510-353-2",

publisher = "Eindhoven University of Technology",

type = "Phd Thesis 1 (Research TU/e / Graduation TU/e)",

school = "Mechanical Engineering",

}