| Original language | English |
|---|---|
| Title of host publication | Fluctuations et bruit : seminaire, Vercorin (Suisse), 27 Fevrier - 4 Mars 2000 |
| Editors | M.A. Py, M.-O. Hongler, J.-P. Laedermann |
| Place of Publication | Paris |
| Publisher | Frontier Group |
| Pages | 67-96 |
| Number of pages | 30 |
| ISBN (Print) | 2-86332-251-6 |
| Publication status | Published - 2001 |
Noise in materials: Low frequency noise as a diagnostic tool for reliability and quality assessment of electronic devices
L.K.J. Vandamme
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review
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