Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

P. Sakian Dezfuli; E.J.G. Janssen; J.A.J. Essing; R. Mahmoudi; A.H.M. Roermund, van

doi:10.1109/ARFTG76.2010.5700051

Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

P. Sakian Dezfuli
, E.J.G. Janssen
, J.A.J. Essing
, R. Mahmoudi
, A.H.M. Roermund, van

Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

643 Downloads (Pure)

Abstract

On-wafer measurement setups are introduced for measuring the noise figure and s-parameters of differential 60GHz circuits. The need for expensive four-port mm-wave vector network analyzers is circumvented by using magic-Ts, providing a minimum CMRR of 20dB, in combination with cheaper two-port mm-wave network analyzers. Waveguide interfaces are used in the vicinity of the RF probes to achieve a robust and repeatable setup, as the cables at mm-wave frequencies are prone to impedance and delay variation due to movement and bending. The noise figure of a double-balanced 60GHz mixer and the noise figure and s-parameters of a differential 60GHz LNA are measured using this setup and the measurement results are in good agreement with the simulations.

Original language	English
Title of host publication	Proceedings of the 2010 76th ARFTGMicrowave Measurement Symposium (ARFTG), November 30th - December 3rd 2010, Clearwater Beach, Florida
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	1-4
ISBN (Print)	978-1-4244-7447-9
DOIs	https://doi.org/10.1109/ARFTG76.2010.5700051
Publication status	Published - 2010
Event	conference; ARFTG; 2010-11-30; 2010-12-01 - Duration: 30 Nov 2010 → 1 Dec 2010

Conference

Conference	conference; ARFTG; 2010-11-30; 2010-12-01
Period	30/11/10 → 1/12/10
Other	ARFTG

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10.1109/ARFTG76.2010.5700051

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Sakian Dezfuli, P., Janssen, E. J. G., Essing, J. A. J., Mahmoudi, R., & Roermund, van, A. H. M. (2010). Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits. In Proceedings of the 2010 76th ARFTGMicrowave Measurement Symposium (ARFTG), November 30th - December 3rd 2010, Clearwater Beach, Florida (pp. 1-4). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ARFTG76.2010.5700051

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title = "Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits",

abstract = "On-wafer measurement setups are introduced for measuring the noise figure and s-parameters of differential 60GHz circuits. The need for expensive four-port mm-wave vector network analyzers is circumvented by using magic-Ts, providing a minimum CMRR of 20dB, in combination with cheaper two-port mm-wave network analyzers. Waveguide interfaces are used in the vicinity of the RF probes to achieve a robust and repeatable setup, as the cables at mm-wave frequencies are prone to impedance and delay variation due to movement and bending. The noise figure of a double-balanced 60GHz mixer and the noise figure and s-parameters of a differential 60GHz LNA are measured using this setup and the measurement results are in good agreement with the simulations.",

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Sakian Dezfuli, P, Janssen, EJG, Essing, JAJ, Mahmoudi, R & Roermund, van, AHM 2010, Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits. in Proceedings of the 2010 76th ARFTGMicrowave Measurement Symposium (ARFTG), November 30th - December 3rd 2010, Clearwater Beach, Florida. Institute of Electrical and Electronics Engineers, Piscataway, pp. 1-4, conference; ARFTG; 2010-11-30; 2010-12-01, 30/11/10. https://doi.org/10.1109/ARFTG76.2010.5700051

Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits. / Sakian Dezfuli, P.; Janssen, E.J.G.; Essing, J.A.J. et al.
Proceedings of the 2010 76th ARFTGMicrowave Measurement Symposium (ARFTG), November 30th - December 3rd 2010, Clearwater Beach, Florida. Piscataway: Institute of Electrical and Electronics Engineers, 2010. p. 1-4.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AB - On-wafer measurement setups are introduced for measuring the noise figure and s-parameters of differential 60GHz circuits. The need for expensive four-port mm-wave vector network analyzers is circumvented by using magic-Ts, providing a minimum CMRR of 20dB, in combination with cheaper two-port mm-wave network analyzers. Waveguide interfaces are used in the vicinity of the RF probes to achieve a robust and repeatable setup, as the cables at mm-wave frequencies are prone to impedance and delay variation due to movement and bending. The noise figure of a double-balanced 60GHz mixer and the noise figure and s-parameters of a differential 60GHz LNA are measured using this setup and the measurement results are in good agreement with the simulations.

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Sakian Dezfuli P, Janssen EJG, Essing JAJ, Mahmoudi R, Roermund, van AHM. Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits. In Proceedings of the 2010 76th ARFTGMicrowave Measurement Symposium (ARFTG), November 30th - December 3rd 2010, Clearwater Beach, Florida. Piscataway: Institute of Electrical and Electronics Engineers. 2010. p. 1-4 doi: 10.1109/ARFTG76.2010.5700051

Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

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