Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

P. Sakian Dezfuli, E.J.G. Janssen, J.A.J. Essing, R. Mahmoudi, A.H.M. Roermund, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
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On-wafer measurement setups are introduced for measuring the noise figure and s-parameters of differential 60GHz circuits. The need for expensive four-port mm-wave vector network analyzers is circumvented by using magic-Ts, providing a minimum CMRR of 20dB, in combination with cheaper two-port mm-wave network analyzers. Waveguide interfaces are used in the vicinity of the RF probes to achieve a robust and repeatable setup, as the cables at mm-wave frequencies are prone to impedance and delay variation due to movement and bending. The noise figure of a double-balanced 60GHz mixer and the noise figure and s-parameters of a differential 60GHz LNA are measured using this setup and the measurement results are in good agreement with the simulations.
Original languageEnglish
Title of host publicationProceedings of the 2010 76th ARFTGMicrowave Measurement Symposium (ARFTG), November 30th - December 3rd 2010, Clearwater Beach, Florida
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Print)978-1-4244-7447-9
Publication statusPublished - 2010
Eventconference; ARFTG; 2010-11-30; 2010-12-01 -
Duration: 30 Nov 20101 Dec 2010


Conferenceconference; ARFTG; 2010-11-30; 2010-12-01


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