NoC Monitoring: Impact on the Design Flow

C. Ciordas, K.G.W. Goossens, A. Radulescu, T. Basten

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

25 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings the IEEE International Symposium on Circuits and SYStems, 2006
Place of PublicationLos Alamitos, USA
PublisherIEEE Computer Society
ISBN (Print)0-7803-9390-2
Publication statusPublished - 2006
Eventconference; ASCAS 2006, Kos, greece; 2006-05-21; 2006-05-24 -
Duration: 21 May 200624 May 2006


Conferenceconference; ASCAS 2006, Kos, greece; 2006-05-21; 2006-05-24
OtherASCAS 2006, Kos, greece

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