New electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range

T. Oudheusden, van, E.F. Jong, de, B.J. Siwick, S.B. Geer, van der, W.P.E.M. Root, op 't, O.J. Luiten

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction expts. in the 100 keV energy range. A combination of anal. results and state-of-the-art numerical simulations show that it is possible to create 100 keV, 0.1 pC, 20 fs electron bunches with a spotsize smaller than 500 mm and a transverse coherence length of 3 nm, using established technologies in a table-top set-up. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by established radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing an entirely new ultrafast electron diffraction source concept.
Original languageEnglish
Title of host publicationAccelerator Physics
PublisherLos Alamos National Laboratory
Pages1-4, arXiv
Publication statusPublished - 2007

Fingerprint

Dive into the research topics of 'New electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range'. Together they form a unique fingerprint.

Cite this