Neutron-induced failure in super-junction, IGBT, and SiC power devices

A. Griffoni; J. Duivenbode, van; D. Linten; E. Simoen; P. Rech; L. Dilillo; F. Wrobel; P. Verbist; G. Groeseneken

doi:10.1109/RADECS.2011.6131395

Neutron-induced failure in super-junction, IGBT, and SiC power devices

A. Griffoni, J. Duivenbode, van, D. Linten, E. Simoen, P. Rech, L. Dilillo, F. Wrobel, P. Verbist, G. Groeseneken

Electromechanics and Power Electronics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

6 Citations (Scopus)

2 Downloads (Pure)

Abstract

50 MeV and 80 MeV neutron-induced failure is investigated for several types of power devices (super-junction, IGBT and SiC) from different vendors. A strong dependence on the device type and orientation is observed.

Original language	English
Title of host publication	Proceedings of 12th European Conference on Radiation Effects on Components and Systems(Radecs), 19-23 September 2011, Sevilla, Spain
Publisher	Institute of Electrical and Electronics Engineers
ISBN (Print)	978-1-4577-0585-4
DOIs	https://doi.org/10.1109/RADECS.2011.6131395
Publication status	Published - 2011
Event	conference; Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on; 2011-09-19; 2011-09-23 - Duration: 19 Sept 2011 → 23 Sept 2011

Conference

Conference	conference; Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on; 2011-09-19; 2011-09-23
Period	19/09/11 → 23/09/11
Other	Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

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10.1109/RADECS.2011.6131395

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Griffoni, A., Duivenbode, van, J., Linten, D., Simoen, E., Rech, P., Dilillo, L., Wrobel, F., Verbist, P., & Groeseneken, G. (2011). Neutron-induced failure in super-junction, IGBT, and SiC power devices. In Proceedings of 12th European Conference on Radiation Effects on Components and Systems(Radecs), 19-23 September 2011, Sevilla, Spain Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/RADECS.2011.6131395

@inproceedings{27662ca50e3e4310b2c9718de2546ce0,

title = "Neutron-induced failure in super-junction, IGBT, and SiC power devices",

abstract = "50 MeV and 80 MeV neutron-induced failure is investigated for several types of power devices (super-junction, IGBT and SiC) from different vendors. A strong dependence on the device type and orientation is observed.",

author = "A. Griffoni and {Duivenbode, van}, J. and D. Linten and E. Simoen and P. Rech and L. Dilillo and F. Wrobel and P. Verbist and G. Groeseneken",

year = "2011",

doi = "10.1109/RADECS.2011.6131395",

language = "English",

isbn = "978-1-4577-0585-4",

booktitle = "Proceedings of 12th European Conference on Radiation Effects on Components and Systems(Radecs), 19-23 September 2011, Sevilla, Spain",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "conference; Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on; 2011-09-19; 2011-09-23 ; Conference date: 19-09-2011 Through 23-09-2011",

}

Griffoni, A, Duivenbode, van, J, Linten, D, Simoen, E, Rech, P, Dilillo, L, Wrobel, F, Verbist, P & Groeseneken, G 2011, Neutron-induced failure in super-junction, IGBT, and SiC power devices. in Proceedings of 12th European Conference on Radiation Effects on Components and Systems(Radecs), 19-23 September 2011, Sevilla, Spain. Institute of Electrical and Electronics Engineers, conference; Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on; 2011-09-19; 2011-09-23, 19/09/11. https://doi.org/10.1109/RADECS.2011.6131395

Neutron-induced failure in super-junction, IGBT, and SiC power devices. / Griffoni, A.; Duivenbode, van, J.; Linten, D. et al.
Proceedings of 12th European Conference on Radiation Effects on Components and Systems(Radecs), 19-23 September 2011, Sevilla, Spain. Institute of Electrical and Electronics Engineers, 2011.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Neutron-induced failure in super-junction, IGBT, and SiC power devices

AU - Griffoni, A.

AU - Duivenbode, van, J.

AU - Linten, D.

AU - Simoen, E.

AU - Rech, P.

AU - Dilillo, L.

AU - Wrobel, F.

AU - Verbist, P.

AU - Groeseneken, G.

PY - 2011

Y1 - 2011

N2 - 50 MeV and 80 MeV neutron-induced failure is investigated for several types of power devices (super-junction, IGBT and SiC) from different vendors. A strong dependence on the device type and orientation is observed.

AB - 50 MeV and 80 MeV neutron-induced failure is investigated for several types of power devices (super-junction, IGBT and SiC) from different vendors. A strong dependence on the device type and orientation is observed.

U2 - 10.1109/RADECS.2011.6131395

DO - 10.1109/RADECS.2011.6131395

M3 - Conference contribution

SN - 978-1-4577-0585-4

BT - Proceedings of 12th European Conference on Radiation Effects on Components and Systems(Radecs), 19-23 September 2011, Sevilla, Spain

PB - Institute of Electrical and Electronics Engineers

T2 - conference; Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on; 2011-09-19; 2011-09-23

Y2 - 19 September 2011 through 23 September 2011

ER -

Griffoni A, Duivenbode, van J, Linten D, Simoen E, Rech P, Dilillo L et al. Neutron-induced failure in super-junction, IGBT, and SiC power devices. In Proceedings of 12th European Conference on Radiation Effects on Components and Systems(Radecs), 19-23 September 2011, Sevilla, Spain. Institute of Electrical and Electronics Engineers. 2011 doi: 10.1109/RADECS.2011.6131395

Neutron-induced failure in super-junction, IGBT, and SiC power devices

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