Neutron diffraction on the diluted magnetic semiconductor tin manganese telluride

C.W.H.M. Vennix, E. Frikkee, H.J.M. Swagten, K. Kopinga, W.J.M. Jonge, de

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10 Citations (Scopus)
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Abstract

In the diluted magnetic semiconductor Sn1-xMnxTe, magnetic ordering occurs at low temperature when the charge carrier density p exceeds a critical value. By means of single-crystal neutron diffraction on samples with x=0.03, p = 7 × 1020 cm-3 and x=0.06, p = 11 × 1020 cm-3, we have shown that this ordered phase is ferromagnetic. For the 6% Mn crystal indications were found for magnetic fluctuations just below the ordering temperature. The experimental results rule out the existence of a (reentrant) spin-glass phase at these Mn concentrations and charge carrier densities.
Original languageEnglish
Pages (from-to)6025-6027
Number of pages3
JournalJournal of Applied Physics
Volume69
Issue number8
DOIs
Publication statusPublished - 1991

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