Neural networks applied to inspection tasks : measuring the quality of prints on industrial products

J.W. Stap, Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Information and Communication Technology (ICT)

Research output: ThesisPd Eng Thesis

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
Supervisors/Advisors
  • de Hegt, J.A. (Hans), Supervisor
  • Lier, van, A., External supervisor, External person
Award date1 Jan 1995
Place of PublicationEindhoven
Publisher
Print ISBNs90-5282-430-4
Publication statusPublished - 1995

Bibliographical note

Eindverslag

Cite this

Stap, J. W., & Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Information and Communication Technology (ICT) (1995). Neural networks applied to inspection tasks : measuring the quality of prints on industrial products. Technische Universiteit Eindhoven.