Neural networks applied to inspection tasks : measuring the quality of prints on industrial products

J.W. Stap, Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Information and Communication Technology (ICT)

Research output: ThesisEngD Thesis

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • de Hegt, J.A. (Hans), Supervisor
  • Lier, van, A., External supervisor, External person
Award date1 Jan 1995
Place of PublicationEindhoven
Print ISBNs90-5282-430-4
Publication statusPublished - 1995

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