NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces)

R. Henselmans; P.C.J.N. Rosielle; J.P. Kappelhof

NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces)

R. Henselmans
, P.C.J.N. Rosielle
, J.P. Kappelhof

Control Systems Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Original language	English
Title of host publication	Proceedings of free-form optics : design, fabrication, metrology, assembly : 2004 winter topical meeting, February 4-5, 2004, Chapel Hill, North Carolina
Editors	T.A. Dow
Place of Publication	Raleigh, NC
Publisher	American Society of Precision Engineering (ASPE)
Pages	97-101
ISBN (Print)	1-88770-633-X
Publication status	Published - 2004

Nanomefos
Rosielle, P. C. J. N. (Manager)
Mechanical Engineering
Facility/equipment: Equipment

Cite this

Henselmans, R., Rosielle, P. C. J. N., & Kappelhof, J. P. (2004). NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces). In T. A. Dow (Ed.), Proceedings of free-form optics : design, fabrication, metrology, assembly : 2004 winter topical meeting, February 4-5, 2004, Chapel Hill, North Carolina (pp. 97-101). American Society of Precision Engineering (ASPE).

Henselmans, R. ; Rosielle, P.C.J.N. ; Kappelhof, J.P. / NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces). Proceedings of free-form optics : design, fabrication, metrology, assembly : 2004 winter topical meeting, February 4-5, 2004, Chapel Hill, North Carolina . editor / T.A. Dow. Raleigh, NC : American Society of Precision Engineering (ASPE), 2004. pp. 97-101

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title = "NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces)",

author = "R. Henselmans and P.C.J.N. Rosielle and J.P. Kappelhof",

year = "2004",

language = "English",

isbn = "1-88770-633-X",

pages = "97--101",

editor = "T.A. Dow",

booktitle = "Proceedings of free-form optics : design, fabrication, metrology, assembly : 2004 winter topical meeting, February 4-5, 2004, Chapel Hill, North Carolina",

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Henselmans, R, Rosielle, PCJN & Kappelhof, JP 2004, NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces). in TA Dow (ed.), Proceedings of free-form optics : design, fabrication, metrology, assembly : 2004 winter topical meeting, February 4-5, 2004, Chapel Hill, North Carolina . American Society of Precision Engineering (ASPE), Raleigh, NC, pp. 97-101.

NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces). / Henselmans, R.; Rosielle, P.C.J.N.; Kappelhof, J.P.
Proceedings of free-form optics : design, fabrication, metrology, assembly : 2004 winter topical meeting, February 4-5, 2004, Chapel Hill, North Carolina . ed. / T.A. Dow. Raleigh, NC: American Society of Precision Engineering (ASPE), 2004. p. 97-101.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces)

AU - Henselmans, R.

AU - Rosielle, P.C.J.N.

AU - Kappelhof, J.P.

PY - 2004

Y1 - 2004

M3 - Conference contribution

SN - 1-88770-633-X

SP - 97

EP - 101

BT - Proceedings of free-form optics : design, fabrication, metrology, assembly : 2004 winter topical meeting, February 4-5, 2004, Chapel Hill, North Carolina

A2 - Dow, T.A.

PB - American Society of Precision Engineering (ASPE)

CY - Raleigh, NC

ER -

Henselmans R, Rosielle PCJN, Kappelhof JP. NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces). In Dow TA, editor, Proceedings of free-form optics : design, fabrication, metrology, assembly : 2004 winter topical meeting, February 4-5, 2004, Chapel Hill, North Carolina . Raleigh, NC: American Society of Precision Engineering (ASPE). 2004. p. 97-101

NANOMEFOS (nanometr accuracy non-contact measurement of free-form optical surfaces)

Equipment

Nanomefos

Cite this