Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

P. Putek, R. Janssen, J. Niehof, E.J.W. ter Maten, R. Pulch, B. Tasic, M. Günther

Research output: Book/ReportReportAcademic

74 Downloads (Pure)
Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages7
Publication statusPublished - Oct 2016

Publication series

NameCASA-report
Volume1622
ISSN (Print)0926-4507

Cite this

Putek, P., Janssen, R., Niehof, J., ter Maten, E. J. W., Pulch, R., Tasic, B., & Günther, M. (2016). Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference. (CASA-report; Vol. 1622). Eindhoven: Technische Universiteit Eindhoven.
Putek, P. ; Janssen, R. ; Niehof, J. ; ter Maten, E.J.W. ; Pulch, R. ; Tasic, B. ; Günther, M. / Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference. Eindhoven : Technische Universiteit Eindhoven, 2016. 7 p. (CASA-report).
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Putek, P, Janssen, R, Niehof, J, ter Maten, EJW, Pulch, R, Tasic, B & Günther, M 2016, Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference. CASA-report, vol. 1622, Technische Universiteit Eindhoven, Eindhoven.

Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference. / Putek, P.; Janssen, R.; Niehof, J.; ter Maten, E.J.W.; Pulch, R.; Tasic, B.; Günther, M.

Eindhoven : Technische Universiteit Eindhoven, 2016. 7 p. (CASA-report; Vol. 1622).

Research output: Book/ReportReportAcademic

TY - BOOK

T1 - Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

AU - Putek, P.

AU - Janssen, R.

AU - Niehof, J.

AU - ter Maten, E.J.W.

AU - Pulch, R.

AU - Tasic, B.

AU - Günther, M.

PY - 2016/10

Y1 - 2016/10

M3 - Report

T3 - CASA-report

BT - Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -

Putek P, Janssen R, Niehof J, ter Maten EJW, Pulch R, Tasic B et al. Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference. Eindhoven: Technische Universiteit Eindhoven, 2016. 7 p. (CASA-report).