Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

P. Putek, R. Janssen, J. Niehof, E.J.W. ter Maten, R. Pulch, B. Tasic, M. Günther

Research output: Book/ReportReportAcademic

181 Downloads (Pure)
Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages7
Publication statusPublished - Oct 2016

Publication series

ISSN (Print)0926-4507

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