Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

P. Putek, R. Janssen, J. Niehof, E.J.W. ter Maten, R. Pulch, B. Tasic, M. Günther

Research output: Book/Report › Report › Academic

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Original language	English
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Number of pages	7
Publication status	Published - Oct 2016

Access to Document

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title = "Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference",

author = "P. Putek and R. Janssen and J. Niehof and {ter Maten}, E.J.W. and R. Pulch and B. Tasic and M. G{\"u}nther",

year = "2016",

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language = "English",

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publisher = "Technische Universiteit Eindhoven",

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AU - Janssen, R.

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AU - ter Maten, E.J.W.

AU - Pulch, R.

AU - Tasic, B.

AU - Günther, M.

PY - 2016/10

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