Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference

P. Putek, R. Janssen, J. Niehof, E.J.W. ter Maten, R. Pulch, B. Tasic, M. Günther

Research output: Book/ReportReportAcademic

88 Downloads (Pure)
Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages7
Publication statusPublished - Oct 2016

Publication series

NameCASA-report
Volume1622
ISSN (Print)0926-4507

Cite this

Putek, P., Janssen, R., Niehof, J., ter Maten, E. J. W., Pulch, R., Tasic, B., & Günther, M. (2016). Nanoelectronic coupled problem solutions: uncertainty quantification of RFIC interference. (CASA-report; Vol. 1622). Eindhoven: Technische Universiteit Eindhoven.