Multiple views on system traces

A.J. Pretorius; J.J. Wijk, van

doi:10.1109/PACIFICVIS.2008.4475464

Multiple views on system traces

A.J. Pretorius, J.J. Wijk, van

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

Abstract

We present a new method for the visual analysis of multivariate system traces. Our method combines three perspectives: (1) a schematic diagram, (2) time series plots and (3) a state transition graph. After we show how these perspectives are related, we discuss their integration into a single solution for the visual analysis of multivariate system traces. The combination of the three perspectives provides the user with a rich analysis interface that enables gaining significant insight into system behavior. We illustrate some of the advantages of our approach by providing a real-world use case.

Original language	English
Title of host publication	Proceedings IEEE VGTC Pacific Visualization Symposium (IEEE PacificVis 2008, Kyoto, Japan, March 4-7, 2008)
Place of Publication	Piscataway NJ
Publisher	Institute of Electrical and Electronics Engineers
Pages	95-102
ISBN (Print)	978-1-4244-1966-1
DOIs	https://doi.org/10.1109/PACIFICVIS.2008.4475464
Publication status	Published - 2008

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10.1109/PACIFICVIS.2008.4475464

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title = "Multiple views on system traces",

abstract = "We present a new method for the visual analysis of multivariate system traces. Our method combines three perspectives: (1) a schematic diagram, (2) time series plots and (3) a state transition graph. After we show how these perspectives are related, we discuss their integration into a single solution for the visual analysis of multivariate system traces. The combination of the three perspectives provides the user with a rich analysis interface that enables gaining significant insight into system behavior. We illustrate some of the advantages of our approach by providing a real-world use case.",

author = "A.J. Pretorius and {Wijk, van}, J.J.",

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Multiple views on system traces. / Pretorius, A.J.; Wijk, van, J.J.
Proceedings IEEE VGTC Pacific Visualization Symposium (IEEE PacificVis 2008, Kyoto, Japan, March 4-7, 2008). Piscataway NJ: Institute of Electrical and Electronics Engineers, 2008. p. 95-102.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

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AU - Pretorius, A.J.

AU - Wijk, van, J.J.

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AB - We present a new method for the visual analysis of multivariate system traces. Our method combines three perspectives: (1) a schematic diagram, (2) time series plots and (3) a state transition graph. After we show how these perspectives are related, we discuss their integration into a single solution for the visual analysis of multivariate system traces. The combination of the three perspectives provides the user with a rich analysis interface that enables gaining significant insight into system behavior. We illustrate some of the advantages of our approach by providing a real-world use case.

U2 - 10.1109/PACIFICVIS.2008.4475464

DO - 10.1109/PACIFICVIS.2008.4475464

M3 - Conference contribution

SN - 978-1-4244-1966-1

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EP - 102

BT - Proceedings IEEE VGTC Pacific Visualization Symposium (IEEE PacificVis 2008, Kyoto, Japan, March 4-7, 2008)

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway NJ

ER -

Multiple views on system traces

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