TY - GEN
T1 - Multilevel Gate Driver with Adjustable Gate Voltage for Thermal Stress Reduction of Power Switches in Electric Drive Application
AU - Wang, Lie
AU - Vermulst, Bas J.D.
AU - Duarte, Jorge L.
PY - 2020
Y1 - 2020
N2 - Due to varying load currents, the junction temperature variations of power switches causes thermal stress and compromises lifetime. In this paper, proper gate voltage control is used for all power switches in a three-phase electric drive to smooth the profile of conduction losses, therefore reducing thermal stress. A multilevel gate driver with an adjustable gate voltage is introduced for experimental verification of the thermal control method. The lifetime is estimated at last, which indicates an improvement by a factor of two.
AB - Due to varying load currents, the junction temperature variations of power switches causes thermal stress and compromises lifetime. In this paper, proper gate voltage control is used for all power switches in a three-phase electric drive to smooth the profile of conduction losses, therefore reducing thermal stress. A multilevel gate driver with an adjustable gate voltage is introduced for experimental verification of the thermal control method. The lifetime is estimated at last, which indicates an improvement by a factor of two.
UR - http://www.scopus.com/inward/record.url?scp=85089696609&partnerID=8YFLogxK
M3 - Conference contribution
SN - 9783800752454
T3 - PCIM Europe Conference Proceedings
SP - 1536
EP - 1543
BT - PCIM Europe-International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2020
T2 - PCIM Europe Digital days
Y2 - 7 July 2020 through 8 July 2020
ER -