| Original language | English |
|---|---|
| Title of host publication | Proceedings of the IEEE Int. Mixed signal Test Workshop, Seville, June 2003 |
| Pages | 3-6 |
| Publication status | Published - 2003 |
Multi-Vdd Testing of Analog Circuits
J. Pineda de Gyvez, G. Gronthoud, R. Amine
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review