Multi-Vdd Testing of Analog Circuits

J. Pineda de Gyvez, G. Gronthoud, R. Amine

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of the IEEE Int. Mixed signal Test Workshop, Seville, June 2003
Pages3-6
Publication statusPublished - 2003

Cite this

Pineda de Gyvez, J., Gronthoud, G., & Amine, R. (2003). Multi-Vdd Testing of Analog Circuits. In Proceedings of the IEEE Int. Mixed signal Test Workshop, Seville, June 2003 (pp. 3-6)