Multi-level nanoimprint lithography for large-area thin film transistor backplane manufacturing

Tamer Dogan, Joris de Riet, Thijs Bel, Roy Verbeek, Ilias Katsouras, Eric Meulenkamp, Gerwin Gelinck, Auke Jisk Kronemeijer (Corresponding author)

Research output: Contribution to journal › Article › Academic › peer-review

2 Citations (Scopus)

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Material Science