Multi-layer perceptrons for on-line lot sizing

H.P. Stehouwer, E.H.L. Aarts, J. Wessels

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings INRIA/IEEE Symposium on Emerging Technologies and Factory Automation (ETFA'95, Paris, France, October 10-13, 1995)
Pages279-287
DOIs
Publication statusPublished - 1995

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