Morphology and composition of Au films on Si(100)

W.C.A.N. Ceelen; M. Ridder, de; B. Moest; A.W. Denier van der Gon; H.H. Brongersma

doi:10.1016/S0039-6028(99)00428-8

Morphology and composition of Au films on Si(100)

W.C.A.N. Ceelen
, M. Ridder, de
, B. Moest
, A.W. Denier van der Gon
, H.H. Brongersma

Applied Physics and Science Education

Research output: Contribution to journal › Article › Academic › peer-review

11 Citations (Scopus)

Abstract

Spot profile analysis low-energy electron diffraction, low-energy ion scattering and Auger electron spectroscopy were employed to study the morphology and composition of Au films on Si(100). After annealing, two distinct surface reconstructions were observed: a two-domain c(8×2) phase and a four-domain incommensurate (5×3.2)R5.7° phase. During the transition from the c(8×2) to the (5×3.2)R5.7° phase, the subsurface composition changes drastically from Au-rich to Si-rich, whereas the outermost layer composition remains almost constant (about 65 at.% Au). Detailed information concerning the domain structure for the two phases is subtracted from the profiles of the LEED spots.

Original language	English
Pages (from-to)	146-153
Number of pages	8
Journal	Surface Science
Volume	430
Issue number	1-3
DOIs	https://doi.org/10.1016/S0039-6028(99)00428-8
Publication status	Published - 1999

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title = "Morphology and composition of Au films on Si(100)",

abstract = "Spot profile analysis low-energy electron diffraction, low-energy ion scattering and Auger electron spectroscopy were employed to study the morphology and composition of Au films on Si(100). After annealing, two distinct surface reconstructions were observed: a two-domain c(8×2) phase and a four-domain incommensurate (5×3.2)R5.7° phase. During the transition from the c(8×2) to the (5×3.2)R5.7° phase, the subsurface composition changes drastically from Au-rich to Si-rich, whereas the outermost layer composition remains almost constant (about 65 at.\% Au). Detailed information concerning the domain structure for the two phases is subtracted from the profiles of the LEED spots.",

author = "W.C.A.N. Ceelen and \{Ridder, de\}, M. and B. Moest and \{Denier van der Gon\}, A.W. and H.H. Brongersma",

year = "1999",

doi = "10.1016/S0039-6028(99)00428-8",

language = "English",

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pages = "146--153",

journal = "Surface Science",

issn = "0039-6028",

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TY - JOUR

T1 - Morphology and composition of Au films on Si(100)

AU - Ceelen, W.C.A.N.

AU - Ridder, de, M.

AU - Moest, B.

AU - Denier van der Gon, A.W.

AU - Brongersma, H.H.

PY - 1999

Y1 - 1999

N2 - Spot profile analysis low-energy electron diffraction, low-energy ion scattering and Auger electron spectroscopy were employed to study the morphology and composition of Au films on Si(100). After annealing, two distinct surface reconstructions were observed: a two-domain c(8×2) phase and a four-domain incommensurate (5×3.2)R5.7° phase. During the transition from the c(8×2) to the (5×3.2)R5.7° phase, the subsurface composition changes drastically from Au-rich to Si-rich, whereas the outermost layer composition remains almost constant (about 65 at.% Au). Detailed information concerning the domain structure for the two phases is subtracted from the profiles of the LEED spots.

AB - Spot profile analysis low-energy electron diffraction, low-energy ion scattering and Auger electron spectroscopy were employed to study the morphology and composition of Au films on Si(100). After annealing, two distinct surface reconstructions were observed: a two-domain c(8×2) phase and a four-domain incommensurate (5×3.2)R5.7° phase. During the transition from the c(8×2) to the (5×3.2)R5.7° phase, the subsurface composition changes drastically from Au-rich to Si-rich, whereas the outermost layer composition remains almost constant (about 65 at.% Au). Detailed information concerning the domain structure for the two phases is subtracted from the profiles of the LEED spots.

U2 - 10.1016/S0039-6028(99)00428-8

DO - 10.1016/S0039-6028(99)00428-8

M3 - Article

SN - 0039-6028

VL - 430

SP - 146

EP - 153

JO - Surface Science

JF - Surface Science

IS - 1-3

ER -

Morphology and composition of Au films on Si(100)

Abstract

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