Morphology and composition of Au films on Si(100)

W.C.A.N. Ceelen, M. Ridder, de, B. Moest, A.W. Denier van der Gon, H.H. Brongersma

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)


Spot profile analysis low-energy electron diffraction, low-energy ion scattering and Auger electron spectroscopy were employed to study the morphology and composition of Au films on Si(100). After annealing, two distinct surface reconstructions were observed: a two-domain c(8×2) phase and a four-domain incommensurate (5×3.2)R5.7° phase. During the transition from the c(8×2) to the (5×3.2)R5.7° phase, the subsurface composition changes drastically from Au-rich to Si-rich, whereas the outermost layer composition remains almost constant (about 65 at.% Au). Detailed information concerning the domain structure for the two phases is subtracted from the profiles of the LEED spots.
Original languageEnglish
Pages (from-to)146-153
Number of pages8
JournalSurface Science
Issue number1-3
Publication statusPublished - 1999


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