Monte Carlo simulation of electrons in strained Si1-xGex layers

T.F. Vijverberg, Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Information and Communication Technology (ICT)

Research output: ThesisPd Eng Thesis

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • van de Roer, Theo, Supervisor
  • Widdershoven, F.P., Supervisor
  • Kaufmann, Leon, Supervisor
Award date1 Jan 1995
Place of PublicationEindhoven
Print ISBNs90-5282-481-9
Publication statusPublished - 1995

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