Abstract
We present a case study in monitoring a high-volume production process with a high yield. Testing the products is difficult and is only possible in a destructive way with a defect/no-defect result. We review several attribute charting procedures for high-yield processes. It turns out that monitoring the number of conforming items between the occurrence of non-conforming items is appropriate. We discuss several implementation aspects of CCCr charts in our case study. The implementation is based on a new formula for the standard deviation of the number of inspected items before a signal.
Original language | English |
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Pages (from-to) | 521-528 |
Journal | Quality and Reliability Engineering International |
Volume | 21 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2005 |