Monitoring a single micrometer size particle by angle resolved light scattering

W.W. Stoffels; E. Stoffels -  Adamowicz; G.H.P.M. Swinkels; G.M.W. Kroesen

Monitoring a single micrometer size particle by angle resolved light scattering

W.W. Stoffels, E. Stoffels - Adamowicz, G.H.P.M. Swinkels, G.M.W. Kroesen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

No abstract

Original language	English
Title of host publication	Book of Papers Frontiers in Low Temperature Plasma Diagnostics III
Editors	Ch. Hollenstein
Place of Publication	Lausanne
Publisher	Centre de Recherches en Physique des Plasmas
Pages	195-198
Publication status	Published - 1999
Event	Frontiers in Low Temperature Plasma Diagnostics III, February 15-19, 1999, Saillon, Switzerland - Saillon, Switzerland Duration: 15 Feb 1999 → 19 Feb 1999

Workshop

Workshop	Frontiers in Low Temperature Plasma Diagnostics III, February 15-19, 1999, Saillon, Switzerland
Country/Territory	Switzerland
City	Saillon
Period	15/02/99 → 19/02/99

Cite this

@inproceedings{32e8c7d7ff4d4804903bcdc1d8ee53c7,

title = "Monitoring a single micrometer size particle by angle resolved light scattering",

abstract = "No abstract",

author = "W.W. Stoffels and {Stoffels - Adamowicz}, E. and G.H.P.M. Swinkels and G.M.W. Kroesen",

year = "1999",

language = "English",

pages = "195--198",

editor = "Ch. Hollenstein",

booktitle = "Book of Papers Frontiers in Low Temperature Plasma Diagnostics III",

publisher = "Centre de Recherches en Physique des Plasmas",

note = "Frontiers in Low Temperature Plasma Diagnostics III, February 15-19, 1999, Saillon, Switzerland ; Conference date: 15-02-1999 Through 19-02-1999",

}

Stoffels, WW, Stoffels - Adamowicz, E, Swinkels, GHPM & Kroesen, GMW 1999, Monitoring a single micrometer size particle by angle resolved light scattering. in C Hollenstein (ed.), Book of Papers Frontiers in Low Temperature Plasma Diagnostics III. Centre de Recherches en Physique des Plasmas, Lausanne, pp. 195-198, Frontiers in Low Temperature Plasma Diagnostics III, February 15-19, 1999, Saillon, Switzerland, Saillon, Switzerland, 15/02/99.

Monitoring a single micrometer size particle by angle resolved light scattering. / Stoffels, W.W.; Stoffels - Adamowicz, E.; Swinkels, G.H.P.M. et al.
Book of Papers Frontiers in Low Temperature Plasma Diagnostics III. ed. / Ch. Hollenstein. Lausanne: Centre de Recherches en Physique des Plasmas, 1999. p. 195-198.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Monitoring a single micrometer size particle by angle resolved light scattering

AU - Stoffels, W.W.

AU - Stoffels - Adamowicz, E.

AU - Swinkels, G.H.P.M.

AU - Kroesen, G.M.W.

PY - 1999

Y1 - 1999

N2 - No abstract

AB - No abstract

M3 - Conference contribution

SP - 195

EP - 198

BT - Book of Papers Frontiers in Low Temperature Plasma Diagnostics III

A2 - Hollenstein, Ch.

PB - Centre de Recherches en Physique des Plasmas

CY - Lausanne

T2 - Frontiers in Low Temperature Plasma Diagnostics III, February 15-19, 1999, Saillon, Switzerland

Y2 - 15 February 1999 through 19 February 1999

ER -

Monitoring a single micrometer size particle by angle resolved light scattering

Abstract

Workshop

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