Abstract
Nonlinearities in MEMS silicon resonators are caused by different effects. Depending on the resonator layout, different nonlinearities may be dominant in the resonator response. Based on experimental results, a modelling approach is proposed to arrive at a nonlinear dynamic model that potentially captures the observed behaviour. Apart from the model, consisting of a mechanical and an electrical (measurement) part, the effect of thermal noise is also estimated. With the proposed model, a quantitative match between the simulation and experimental results is established such that a good starting point is achieved for a more thorough modelling procedure.
Original language | English |
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Pages (from-to) | 306-315 |
Number of pages | 10 |
Journal | Sensors and Actuators, A: Physical |
Volume | 142 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2008 |