Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults

F.T.J. Erp, van; J.F.G. Rasing; M.J.M. van Riet; F. Provoost; A.P.J. Deursen, van; P.L.J. Hesen

doi:10.1049/cp:20051001

Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults

F.T.J. Erp, van
, J.F.G. Rasing
, M.J.M. van Riet
, F. Provoost
, A.P.J. Deursen, van
, P.L.J. Hesen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Downloads (Pure)

Abstract

Earth faults in the medium voltage (MV) grid cause touch and step voltages in the low voltage (LV) grid. Since MV and LV grid share their earthing system at the MV-LV transformer, one might question the safety with respect to LV customers in case of a phase-to-earth fault, occurring in the MV grid. Models and actual measurements in a operating grid are preformed to determine the current distribution and touch voltages. The results show that phase-to-earth faults in urban global earthed areas leads to low source voltages for touching. The models show the current distribution phenomena in a global earthed grid.

Original language	English
Title of host publication	18th International Conference on Electricity Distribution (CIRED), Turin, Italy, June 6-9, 2005
Place of Publication	Stevenage, UK
Publisher	Institute of Electrical Engineers
Number of pages	4
ISBN (Electronic)	978-0-86341-534-0
ISBN (Print)	978-0863415333
DOIs	https://doi.org/10.1049/cp:20051001
Publication status	Published - 2005
Event	18th International Conference and Exhibition on Electricity Distribution (CIRED 2005) - Turin, Italy Duration: 6 Jun 2005 → 9 Jun 2005 Conference number: 18

Publication series

Name	IEE Colloquium Digest
Publisher	IEE
Number	11034
ISSN (Print)	0963-3308

Conference

Conference	18th International Conference and Exhibition on Electricity Distribution (CIRED 2005)
Abbreviated title	CIRED 2005
Country/Territory	Italy
City	Turin
Period	6/06/05 → 9/06/05

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10.1049/cp:20051001

Cite this

Erp, van, F. T. J., Rasing, J. F. G., van Riet, M. J. M., Provoost, F., Deursen, van, A. P. J., & Hesen, P. L. J. (2005). Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults. In 18th International Conference on Electricity Distribution (CIRED), Turin, Italy, June 6-9, 2005 (IEE Colloquium Digest; No. 11034). Institute of Electrical Engineers. https://doi.org/10.1049/cp:20051001

@inproceedings{ddacd1e5ca4343ad8a58cdd238accb15,

title = "Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults",

abstract = "Earth faults in the medium voltage (MV) grid cause touch and step voltages in the low voltage (LV) grid. Since MV and LV grid share their earthing system at the MV-LV transformer, one might question the safety with respect to LV customers in case of a phase-to-earth fault, occurring in the MV grid. Models and actual measurements in a operating grid are preformed to determine the current distribution and touch voltages. The results show that phase-to-earth faults in urban global earthed areas leads to low source voltages for touching. The models show the current distribution phenomena in a global earthed grid.",

author = "\{Erp, van\}, F.T.J. and J.F.G. Rasing and \{van Riet\}, M.J.M. and F. Provoost and \{Deursen, van\}, A.P.J. and P.L.J. Hesen",

year = "2005",

doi = "10.1049/cp:20051001",

language = "English",

isbn = "978-0863415333",

series = "IEE Colloquium Digest",

publisher = "Institute of Electrical Engineers",

number = "11034",

booktitle = "18th International Conference on Electricity Distribution (CIRED), Turin, Italy, June 6-9, 2005",

address = "United Kingdom",

note = "18th International Conference and Exhibition on Electricity Distribution (CIRED 2005), CIRED 2005 ; Conference date: 06-06-2005 Through 09-06-2005",

}

Erp, van, FTJ, Rasing, JFG, van Riet, MJM, Provoost, F, Deursen, van, APJ & Hesen, PLJ 2005, Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults. in 18th International Conference on Electricity Distribution (CIRED), Turin, Italy, June 6-9, 2005. IEE Colloquium Digest, no. 11034, Institute of Electrical Engineers, Stevenage, UK, 18th International Conference and Exhibition on Electricity Distribution (CIRED 2005), Turin, Italy, 6/06/05. https://doi.org/10.1049/cp:20051001

Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults. / Erp, van, F.T.J.; Rasing, J.F.G.; van Riet, M.J.M. et al.
18th International Conference on Electricity Distribution (CIRED), Turin, Italy, June 6-9, 2005. Stevenage, UK: Institute of Electrical Engineers, 2005. (IEE Colloquium Digest; No. 11034).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults

AU - Erp, van, F.T.J.

AU - Rasing, J.F.G.

AU - van Riet, M.J.M.

AU - Provoost, F.

AU - Deursen, van, A.P.J.

AU - Hesen, P.L.J.

N1 - Conference code: 18

PY - 2005

Y1 - 2005

N2 - Earth faults in the medium voltage (MV) grid cause touch and step voltages in the low voltage (LV) grid. Since MV and LV grid share their earthing system at the MV-LV transformer, one might question the safety with respect to LV customers in case of a phase-to-earth fault, occurring in the MV grid. Models and actual measurements in a operating grid are preformed to determine the current distribution and touch voltages. The results show that phase-to-earth faults in urban global earthed areas leads to low source voltages for touching. The models show the current distribution phenomena in a global earthed grid.

AB - Earth faults in the medium voltage (MV) grid cause touch and step voltages in the low voltage (LV) grid. Since MV and LV grid share their earthing system at the MV-LV transformer, one might question the safety with respect to LV customers in case of a phase-to-earth fault, occurring in the MV grid. Models and actual measurements in a operating grid are preformed to determine the current distribution and touch voltages. The results show that phase-to-earth faults in urban global earthed areas leads to low source voltages for touching. The models show the current distribution phenomena in a global earthed grid.

U2 - 10.1049/cp:20051001

DO - 10.1049/cp:20051001

M3 - Conference contribution

SN - 978-0863415333

T3 - IEE Colloquium Digest

BT - 18th International Conference on Electricity Distribution (CIRED), Turin, Italy, June 6-9, 2005

PB - Institute of Electrical Engineers

CY - Stevenage, UK

T2 - 18th International Conference and Exhibition on Electricity Distribution (CIRED 2005)

Y2 - 6 June 2005 through 9 June 2005

ER -

Erp, van FTJ, Rasing JFG, van Riet MJM, Provoost F, Deursen, van APJ, Hesen PLJ. Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults. In 18th International Conference on Electricity Distribution (CIRED), Turin, Italy, June 6-9, 2005. Stevenage, UK: Institute of Electrical Engineers. 2005. (IEE Colloquium Digest; 11034). doi: 10.1049/cp:20051001

Modelling and live measurements of step and touch voltages at LV customers in urban areas caused by MV faults

Abstract

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