Modelling a time of expiry based medium access control

D. van de Meulenhof, A. Zelst, van, P.F.M. Smulders

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Original language	English
Title of host publication	Proc. PRORISC/IEEE Workshop on Circuits, Systems and Signal Processing
Editors	J.P. Veen
Place of Publication	Utrecht
Pages	399-403
Number of pages	5
Publication status	Published - 1998
Event	STW's SAFE 98 Workshop on Semiconductor Advances for Future Electronics - Mierlo, Netherlands Duration: 26 Nov 1998 → 27 Nov 1998

Conference	STW's SAFE 98 Workshop on Semiconductor Advances for Future Electronics
Abbreviated title	SAFE98
Country/Territory	Netherlands
City	Mierlo
Period	26/11/98 → 27/11/98
Other	the 1st Annual Workshop on Semiconductor Advances for Future Electronics, (SAFE), November 25-27, 1998, Mierlo, the Netherlands

Access to Document

@inproceedings{20975765a7fe49c88b0c2b9c1bf2a455,

title = "Modelling a time of expiry based medium access control",

author = "{van de Meulenhof}, D. and {Zelst, van}, A. and P.F.M. Smulders",

year = "1998",

language = "English",

isbn = "90-73461-15-4",

pages = "399--403",

editor = "J.P. Veen",

booktitle = "Proc. PRORISC/IEEE Workshop on Circuits, Systems and Signal Processing",

note = "STW's SAFE 98 Workshop on Semiconductor Advances for Future Electronics, SAFE98 ; Conference date: 26-11-1998 Through 27-11-1998",

}

TY - GEN

T1 - Modelling a time of expiry based medium access control

AU - van de Meulenhof, D.

AU - Zelst, van, A.

AU - Smulders, P.F.M.

PY - 1998

Y1 - 1998

M3 - Conference contribution

SN - 90-73461-15-4

SP - 399

EP - 403

BT - Proc. PRORISC/IEEE Workshop on Circuits, Systems and Signal Processing

A2 - Veen, J.P.

CY - Utrecht

T2 - STW's SAFE 98 Workshop on Semiconductor Advances for Future Electronics

Y2 - 26 November 1998 through 27 November 1998

ER -