Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes
- Shayesteh Masoumian
- , Roel Maes
- , Rui Wang
- , Karthik Keni Yerriswamy
- , Geert Jan Schrijen
- , Said Hamdioui
- , Mottaqiallah Taouil
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
4
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(Scopus)