Model driven testing based on test history

I. Corro Ramos, A. Di Bucchianico, L. Hakobyan, K.M. Hee, van

Research output: Book/ReportReportAcademic

92 Downloads (Pure)
Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages17
Publication statusPublished - 2007

Publication series

NameComputer science reports
Volume0725
ISSN (Print)0926-4515

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