Model-based testing of hybrid systems

M.P.W.J. Osch, van

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageEnglish
Title of host publicationTangram : model-based integration and testing of complex high-tech systems
EditorsJ. Tretmans
Place of PublicationEindhoven : Embedded Systems Institute
PublisherEmbedded Systems Institute
Pages129-141
ISBN (Print)978-90-78679-02-8
Publication statusPublished - 2007

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