Model-based testing applied for wafer handler acceptance and lot operations

H.A. Tolera

Research output: Thesis › EngD Thesis

Original language	English
Supervisors/Advisors	Cuijpers, Pieter J.L., Supervisor Aerts, Ad T.M., Supervisor
Award date	8 Dec 2016
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Publication status	Published - 8 Dec 2016

Eindverslag

Cite this

@phdthesis{546c2b7ff7514e36826f0473af1e9ad6,

title = "Model-based testing applied for wafer handler acceptance and lot operations",

author = "H.A. Tolera",

note = "Eindverslag",

year = "2016",

month = dec,

day = "8",

language = "English",

series = "PDEng rapport",

publisher = "Technische Universiteit Eindhoven",

type = "EngD Thesis",

}